Electron Energy-Loss Spectroscopy in the Electron Microscope
The Second Edition explores several new applications of EELS developed during the last ten years. Chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.clock- pulses start * dummy video agt;subs. ... At the end of its integration period T, each diode is recharged by applying a bias voltage to the gate of the FET. ... The video circuit contains either a charge-sensitive amplifier or a sample-and-hold circuit whose output voltage represents the amount of discharge of each diode. The.
| Title | : | Electron Energy-Loss Spectroscopy in the Electron Microscope |
| Author | : | R. F. Egerton |
| Publisher | : | Springer Science & Business Media - 1996-01-01 |
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